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Bug 18459
ahci: sata resets breaks raid
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smart data from sdc, mcp67
sdc.smart (text/plain), 4.60 KB, created by
Sergey Bolshakov
on 2009-01-09 18:03:29 MSK
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Description:
smart data from sdc, mcp67
Filename:
MIME Type:
Creator:
Sergey Bolshakov
Created:
2009-01-09 18:03:29 MSK
Size:
4.60 KB
patch
obsolete
>smartctl version 5.38 [x86_64-alt-linux-gnu] Copyright (C) 2002-8 Bruce Allen >Home page is http://smartmontools.sourceforge.net/ > >=== START OF INFORMATION SECTION === >Model Family: SAMSUNG SpinPoint P120 series >Device Model: SAMSUNG SP2504C >Serial Number: S09QJ1ML508269 >Firmware Version: VT100-38 >User Capacity: 250,059,350,016 bytes >Device is: In smartctl database [for details use: -P show] >ATA Version is: 7 >ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a >Local Time is: Fri Jan 9 18:00:10 2009 MSK > >==> WARNING: May need -F samsung3 enabled; see manual for details. > >SMART support is: Available - device has SMART capability. >SMART support is: Enabled > >=== START OF READ SMART DATA SECTION === >SMART overall-health self-assessment test result: PASSED > >General SMART Values: >Offline data collection status: (0x84) Offline data collection activity > was suspended by an interrupting command from host. > Auto Offline Data Collection: Enabled. >Self-test execution status: ( 0) The previous self-test routine completed > without error or no self-test has ever > been run. >Total time to complete Offline >data collection: (4775) seconds. >Offline data collection >capabilities: (0x5b) SMART execute Offline immediate. > Auto Offline data collection on/off support. > Suspend Offline collection upon new > command. > Offline surface scan supported. > Self-test supported. > No Conveyance Self-test supported. > Selective Self-test supported. >SMART capabilities: (0x0003) Saves SMART data before entering > power-saving mode. > Supports SMART auto save timer. >Error logging capability: (0x01) Error logging supported. > General Purpose Logging supported. >Short self-test routine >recommended polling time: ( 1) minutes. >Extended self-test routine >recommended polling time: ( 79) minutes. > >SMART Attributes Data Structure revision number: 16 >Vendor Specific SMART Attributes with Thresholds: >ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE > 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 > 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 5888 > 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 173 > 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 > 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 > 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 > 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 19902 > 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 > 11 Calibration_Retry_Count 0x0012 253 002 000 Old_age Always - 0 > 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 157 >190 Airflow_Temperature_Cel 0x0022 121 100 000 Old_age Always - 39 >194 Temperature_Celsius 0x0022 121 100 000 Old_age Always - 39 >195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 39767812 >196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 >197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 3 >198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 >199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 >200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0 >201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0 >202 TA_Increase_Count 0x0032 100 100 000 Old_age Always - 2 > >SMART Error Log Version: 1 >No Errors Logged > >SMART Self-test log structure revision number 1 >No self-tests have been logged. [To run self-tests, use: smartctl -t] > > >SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 >SMART Selective self-test log data structure revision number 0 >Warning: ATA Specification requires selective self-test log data structure revision number = 1 > SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS > 1 0 0 Not_testing > 2 0 0 Not_testing > 3 0 0 Not_testing > 4 0 0 Not_testing > 5 0 0 Not_testing >Selective self-test flags (0x0): > After scanning selected spans, do NOT read-scan remainder of disk. >If Selective self-test is pending on power-up, resume after 0 minute delay. >
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